• DocumentCode
    658916
  • Title

    A low voltage 8-T SRAM with PVT-tracking bitline sensing margin enhancement for high operating temperature (up to 300°C)

  • Author

    Kim, Tony T. ; Ngoc Le Ba

  • Author_Institution
    IC Design Centre of Excellence, Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2013
  • fDate
    11-13 Nov. 2013
  • Firstpage
    233
  • Lastpage
    236
  • Abstract
    An 8-Kbit low power 8-T SRAM for high temperature (up to 300°C) applications is presented. Near-threshold operation is selected for minimum performance variations over a wide temperate range. We proposed a PVT-tracking bitline sensing margin enhancement technique to improve the bitline swing and the sensing window. Test chips fabricated in a commercial 1.0-μm SOI technology with high temperature interconnection option demonstrates successful SRAM operation at 2 V, 300°C. The power consumption and access time of 0.94 mW and 256ns was achieved at 2 V and 300°C.
  • Keywords
    SRAM chips; low-power electronics; silicon-on-insulator; PVT-tracking bitline sensing margin enhancement; SOI technology; bitline swing; low voltage 8-T SRAM; memory size 8 KByte; near-threshold operation; performance variations; power 0.94 mW; sensing window; size 1.0 mum; temperature 300 degC; time 256 ns; voltage 2 V; CMOS integrated circuits; Integrated circuit interconnections; Reliability; SRAM cells; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference (A-SSCC), 2013 IEEE Asian
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4799-0277-4
  • Type

    conf

  • DOI
    10.1109/ASSCC.2013.6691025
  • Filename
    6691025