DocumentCode :
658942
Title :
A 0.1–1.5 GHz all-digital phase inversion delay-locked loop
Author :
Sangwoo Han ; Taejin Kim ; Jongsun Kim
Author_Institution :
Dept. of Electron. & Electr. Eng., Hongik Univ., Seoul, South Korea
fYear :
2013
fDate :
11-13 Nov. 2013
Firstpage :
341
Lastpage :
344
Abstract :
An all-digital, wide-range phase inversion delay-locked loop (PIDLL) with a high-resolution duty-cycle corrector (DCC) is presented. The proposed PIDLL utilizes a new phase inversion scheme to reduce the total number of delay elements (DEs) in the digitally controlled delay line (DCDL) by approximately one-half, enabling shorter locking times, lower power consumption, reduced jitter performance, and a smaller area, while maintaining a wide operating frequency range. To achieve high delay resolution and linear delay characteristics, a three-stage DCDL using a new area-efficient digital feedback delay element (FDE) is proposed. The FDE is also utilized to implement a new DCC that obtains a duty-cycle error of less than ±0.85% over a 30-70% input duty-cycle range. The proposed DCC-equipped PIDLL is implemented in a 0.13-μm CMOS process, occupies an area of 0.11 mm2, and operates over a wide frequency range of 0.1-1.5 GHz. It dissipates power of 5.9 mW from a 1.2 V supply at 1 GHz and exhibits a peak-to-peak output clock jitter of 11.25 ps at 1.5 GHz.
Keywords :
CMOS digital integrated circuits; CMOS integrated circuits; circuit feedback; delay lines; delay lock loops; digital phase locked loops; CMOS process; DCC; DCDL; DEs; FDE; PIDLL; all-digital wide-range phase inversion delay-locked loop; area-efficient digital feedback delay element; delay elements; digitally controlled delay line; frequency 0.1 GHz to 1.5 GHz; high delay resolution; high-resolution duty-cycle corrector; input duty-cycle range; linear delay characteristics; power 5.9 mW; power consumption; reduced jitter performance; size 0.13 mum; time 11.25 ps; voltage 1.2 V; Clocks; Delay lines; Delays; Frequency control; Jitter; Power demand; Solid state circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference (A-SSCC), 2013 IEEE Asian
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-0277-4
Type :
conf
DOI :
10.1109/ASSCC.2013.6691052
Filename :
6691052
Link To Document :
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