DocumentCode :
658945
Title :
10.3-Gb/s burst-mode CDR with idle insertion and digital calibration in 40-nm CMOS for 10G-EPON systems
Author :
Katsurai, Hiroaki ; Nogawa, Masafumi ; Ohtomo, Y. ; Terada, Jun ; Koizumi, Hirotaka
Author_Institution :
NTT Microsyst. Integration Labs., Atsugi, Japan
fYear :
2013
fDate :
11-13 Nov. 2013
Firstpage :
353
Lastpage :
356
Abstract :
A burst-mode CDR (B-CDR) suffers from a trade-off between jitter transfer and lock time. To solve the trade-off, we utilize a continuous-mode CDR (C-CDR) after a B-CDR with converting the burst signal to the quasi-continuous signal by idle insertion. The B-CDR, designed in 40-nm CMOS, also employs a fully digital, 6-bit automatic frequency calibrator for compensating the process variation. It calibrates the oscillation frequency of the VCO in the B-CDR from 10.3 GHz ± 2 GHz to 10.3 GHz ± 60 MHz. The B-CDR, integrated with the C-CDR, achieves output-data-jitter reduction of 17.3 dB at jitter frequency of 300 MHz and lock time of 220 ns, complying with the 10G-EPON standard.
Keywords :
CMOS integrated circuits; calibration; clock and data recovery circuits; jitter; optical fibre LAN; passive optical networks; voltage-controlled oscillators; volume measurement; 10G-EPON systems; CMOS technology; VCO; automatic frequency calibrator; bit rate 10.3 Gbit/s; burst-mode CDR; clock and data recovery circuits; continuous-mode CDR; digital calibration; frequency 10.3 GHz; frequency 300 MHz; idle insertion; jitter transfer; lock time; process variation; size 40 nm; time 220 ns; voltage-controlled oscillators; word length 6 bit; Calibration; Clocks; Frequency measurement; Jitter; Tuning; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference (A-SSCC), 2013 IEEE Asian
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-0277-4
Type :
conf
DOI :
10.1109/ASSCC.2013.6691055
Filename :
6691055
Link To Document :
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