Title :
Analog behavior in custom IC variation-aware design
Author :
McConaghy, Trent
Author_Institution :
Solido Design Autom. Inc., Canada
Abstract :
This extended abstract describes variation issues in custom integrated circuits (ICs), and how those issues can be addressed via small, specific changes to corner-based design flows. It provides a case study in high-sigma standard cell optimization.
Keywords :
integrated circuit design; analog behavior; corner based design flow; custom IC variation aware design; high sigma standard cell optimization; variation issues; Abstracts; Algorithm design and analysis; Integrated circuit modeling; Monte Carlo methods; Optimization; Performance evaluation; Standards; analog circuit; custom integrated circuit; high-sigma analysis; optimization; process variation; standard cell;
Conference_Titel :
Computer-Aided Design (ICCAD), 2013 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
DOI :
10.1109/ICCAD.2013.6691110
