Title :
Hardware Trojans in wireless cryptographic ICs: Silicon demonstration & detection method evaluation
Author :
Yu Liu ; Yier Jin ; Makris, Yiorgos
Author_Institution :
Dept. of Electr. Eng., Univ. of Texas at Dallas, Dallas, TX, USA
Abstract :
We present a silicon implementation of a hardware Trojan, which is capable of leaking the secret key of a wireless cryptographic integrated circuit (IC) consisting of an Advanced Encryption Standard (AES) core and an Ultra-Wide-Band (UWB) transmitter. With its impact carefully hidden in the transmission specification margins allowed for process variations, this hardware Trojan cannot be detected by production testing methods of either the digital or the analog part of the IC and does not violate the transmission protocol or any system-level specifications. Nevertheless, the informed adversary, who knows what to look for in the transmission power waveform, is capable of retrieving the 128-bit AES key, which is leaked with every 128-bit ciphertext block sent by the UWB transmitter. Using silicon measurements from 40 chips fabricated in TSMC´s 0.35μm technology, we also assess the effectiveness of a side channel-based statistical analysis method in detecting this hardware Trojan.
Keywords :
cryptography; invasive software; microprocessor chips; radio transmitters; radiofrequency integrated circuits; statistical analysis; ultra wideband communication; 128- bit ciphertext block; 128-bit AES key; TSMC 0.35μm technology; UWB transmitter; advanced encryption standard core; hardware trojans; process variations; secret key; side channel-based statistical analysis method; silicon demonstration method evaluation; silicon detection method evaluation; silicon measurements; transmission power waveform; transmission specification margins; ultra-wide-band transmitter; wireless cryptographic IC; wireless cryptographic integrated circuit; Cryptography; Hardware; Integrated circuits; Radio frequency; Transmitters; Trojan horses; Wireless communication;
Conference_Titel :
Computer-Aided Design (ICCAD), 2013 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
DOI :
10.1109/ICCAD.2013.6691149