DocumentCode
659035
Title
Eagle-Eye: A near-optimal statistical framework for noise sensor placement
Author
Tao Wang ; Chun Zhang ; Jinjun Xiong ; Yiyu Shi
Author_Institution
Electr. & Comput. Eng. Dept., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
fYear
2013
fDate
18-21 Nov. 2013
Firstpage
437
Lastpage
443
Abstract
The relentless technology scaling has led to significantly reduced noise margin and complicated functionalities. As such, design time techniques per se are less likely to ensure power integrity, resulting in runtime voltage emergencies. To alleviate the issue, recently several works have shed light on the possibilities of dynamic noise management systems. Most of these works rely on on-chip noise sensors to accurately capture voltage emergencies. However, they all assume, either implicitly or explicitly, that the placement of the sensors is given. It remains an open problem in the literature how to optimally place a given number of noise sensors for best voltage emergency detection. In this paper, we formally define the problem of noise sensor placement along with a novel sensing quality metric (SQM) to be maximized. We then put forward an efficient algorithm to solve it, which is proved to be optimal in the class of polynomial complexity approximations. Experimental results on a set of industrial power grid designs show that compared with a simple average-noise based heuristic and two state-of-the-art temperature sensor placement algorithms aiming at recovering the full map or capturing the hot spots at all times, the proposed method on average can reduce the miss rate of voltage emergency detections by 7.4x, 15x and 6.2x, respectively.
Keywords
noise; sensor placement; statistical analysis; Eagle-Eye; industrial power grid designs; near-optimal statistical framework; noise sensor placement; polynomial complexity approximations; sensing quality metric; temperature sensor placement algorithms; Algorithm design and analysis; Approximation algorithms; Measurement; Noise; Runtime; Temperature sensors; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design (ICCAD), 2013 IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Type
conf
DOI
10.1109/ICCAD.2013.6691154
Filename
6691154
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