DocumentCode :
659119
Title :
Stochastic threshold group testing
Author :
Chan, C.L. ; Cai, Shanyong ; Bakshi, Mayank ; Jaggi, Sidharth ; Saligrama, Venkatesh
Author_Institution :
Chinese Univ. of Hong Kong, Hong Kong, China
fYear :
2013
fDate :
9-13 Sept. 2013
Firstpage :
1
Lastpage :
5
Abstract :
We formulate and analyze a stochastic threshold group testing problem motivated by biological applications. Here a set of n items contains a subset of d ≪ C n defective items. Subsets (pools) of the n items are tested. The test outcomes are negative if the number of defectives in a pool is no larger than l; positive if the pool contains more than u defectives, and stochastic (negative/positive with some probability) if the number of defectives in the pool is in the interval [l, u]. The goal of our stochastic threshold group testing scheme is to identify the set of d defective items via a “small” number of such tests with high probability. In the regime that l = o(d) we present schemes that are computationally feasible to design and implement, and require near-optimal number of tests. Our schemes are robust to a variety of models for probabilistic threshold group testing.
Keywords :
information theory; probability; stochastic processes; biological application; probabilistic threshold group testing; stochastic threshold group testing; Computational complexity; Computational modeling; Decoding; Probabilistic logic; Probability; Stochastic processes; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory Workshop (ITW), 2013 IEEE
Conference_Location :
Sevilla
Print_ISBN :
978-1-4799-1321-3
Type :
conf
DOI :
10.1109/ITW.2013.6691242
Filename :
6691242
Link To Document :
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