Title :
Digital Modulation for Intrinsic Secure Pairing of Wireless Nodes
Author :
Mucchi, L. ; Ronga, Luca Simone ; Del Re, Enrico ; Marcocci, Patrizio
Author_Institution :
Dept. of Electron. & Telecommun., Univ. of Florence, Florence, Italy
Abstract :
Due to the enormous spreading of applied wireless networks, security is actually one of the most important issues for telecommunications. One of the main issue in the field of securing wireless information exchanging is the initial common knowledge between source and destination. A shared secret is normally mandatory in order to decide the encryption (algorithm or code or key) of the information stream. It is usual to exchange this common a priori knowledge by using a quot; securequot; channel. A new modulation technique, able to encrypt the radio signal without any a priori common secret between the two nodes, was previously proposed by the authors [1]-[3]. The information is modulated, at physical layer, by the thermal noise experienced by the link between two terminals. A loop scheme is designed for unique recovering of mutual information. This contribution improves the previous works by exploring the real robustness of the proposed technique against the presence of DOS warriors and impairment of the radio channel, considering also implementation details, such as the bit integration time. Both the case of passive and active attacks have also been implemented and simulated by using the Matlab Simulink.
Keywords :
cryptography; electronic data interchange; modulation; radio networks; thermal noise; wireless channels; DOS; a priori knowledge exchange; active attack; digital modulation technique; information stream encryption; intrinsic secure pairing; loop scheme; mutual information recovery; passive attack; physical layer security; radio signal; secure radio channel; secure wireless information exchange; shared secret; thermal noise; wireless network security; wireless node; Bit error rate; Correlation; Delays; Law; Noise; Wireless communication;
Conference_Titel :
Vehicular Technology Conference (VTC Fall), 2013 IEEE 78th
Conference_Location :
Las Vegas, NV
DOI :
10.1109/VTCFall.2013.6692158