Lifetime Properties in Cluster-Based IEEE 802.15.4WSNs

In this paper we discuss probabilistic node lifetime properties under our new clustering algorithm. We investigate the effects of event sensing reliability and number of clusters on the network lifetime. Our model compares effects of physical layer and MAC layer through bit error rate and packet collision probability. In our analysis, closed-form expressions are obtained for the probability generating functions of different intervals of the algorithm, from which other relevant statistics, such as mean, coefficient of variation and skewness, can be derived. The results show that higher values of mean lifetime can be achieved by either lower values of sensing reliability or lower values of number of clusters. Our results confirm that all nodes will die almost at the same time.