• DocumentCode
    660559
  • Title

    Entropy-based test generation for improved fault localization

  • Author

    Campos, Juan ; Abreu, Rui ; Fraser, Gordon ; d´Amorim, Marcelo

  • Author_Institution
    Fac. of Eng., Univ. of Porto, Porto, Portugal
  • fYear
    2013
  • fDate
    11-15 Nov. 2013
  • Firstpage
    257
  • Lastpage
    267
  • Abstract
    Spectrum-based Bayesian reasoning can effectively rank candidate fault locations based on passing/failing test cases, but the diagnostic quality highly depends on the size and diversity of the underlying test suite. As test suites in practice often do not exhibit the necessary properties, we present a technique to extend existing test suites with new test cases that optimize the diagnostic quality. We apply probability theory concepts to guide test case generation using entropy, such that the amount of uncertainty in the diagnostic ranking is minimized. Our ENTBUG prototype extends the search-based test generation tool EVOSUITE to use entropy in the fitness function of its underlying genetic algorithm, and we applied it to seven real faults. Empirical results show that our approach reduces the entropy of the diagnostic ranking by 49% on average (compared to using the original test suite), leading to a 91% average reduction of diagnosis candidates needed to inspect to find the true faulty one.
  • Keywords
    belief networks; entropy; inference mechanisms; probability; program diagnostics; program testing; software fault tolerance; ENTBUG prototype; EVOSUITE; diagnostic quality; diagnostic ranking; entropy; entropy-based test generation; fitness function; improved fault localization; passing-failing test cases; probability theory concepts; search-based test generation tool; spectrum-based Bayesian reasoning; test case generation; test suite; Cognition; Debugging; Entropy; Genetic algorithms; Sociology; Statistics; Uncertainty; Fault localization; Test case generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automated Software Engineering (ASE), 2013 IEEE/ACM 28th International Conference on
  • Conference_Location
    Silicon Valley, CA
  • Type

    conf

  • DOI
    10.1109/ASE.2013.6693085
  • Filename
    6693085