DocumentCode :
660561
Title :
Personalized defect prediction
Author :
Tian Jiang ; Lin Tan ; Sunghun Kim
Author_Institution :
Univ. of Waterloo, Waterloo, ON, Canada
fYear :
2013
fDate :
11-15 Nov. 2013
Firstpage :
279
Lastpage :
289
Abstract :
Many defect prediction techniques have been proposed. While they often take the author of the code into consideration, none of these techniques build a separate prediction model for each developer. Different developers have different coding styles, commit frequencies, and experience levels, causing different defect patterns. When the defects of different developers are combined, such differences are obscured, hurting prediction performance. This paper proposes personalized defect prediction-building a separate prediction model for each developer to predict software defects. As a proof of concept, we apply our personalized defect prediction to classify defects at the file change level. We evaluate our personalized change classification technique on six large software projects written in C and Java-the Linux kernel, PostgreSQL, Xorg, Eclipse, Lucene and Jackrabbit. Our personalized approach can discover up to 155 more bugs than the traditional change classification (210 versus 55) if developers inspect the top 20% lines of code that are predicted buggy. In addition, our approach improves the F1-score by 0.01-0.06 compared to the traditional change classification.
Keywords :
Java; Linux; program compilers; C software projects; Eclipse; Jackrabbit; Linux kernel; Lucene; PostgreSQL; Xorg; coding styles; commit frequencies; different defect patterns; experience levels; java software projects; personalized defect prediction; separate prediction model; software defect prediction; Computer bugs; Feature extraction; Mars; Predictive models; Syntactics; Training; Vectors; Change classification; machine learning; personalized defect prediction; software reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automated Software Engineering (ASE), 2013 IEEE/ACM 28th International Conference on
Conference_Location :
Silicon Valley, CA
Type :
conf
DOI :
10.1109/ASE.2013.6693087
Filename :
6693087
Link To Document :
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