Title :
Automated inference of classifications and dependencies for combinatorial testing
Author :
Cu Duy Nguyen ; Tonella, Paolo
Author_Institution :
Fondazione Bruno Kessler, Trento, Italy
Abstract :
Even for small programs, the input space is huge - often unbounded. Partition testing divides the input space into disjoint equivalence classes and combinatorial testing selects a subset of all possible input class combinations, according to criteria such as pairwise coverage. The down side of this approach is that the partitioning of the input space into equivalence classes (input classification) is done manually. It is expensive and requires deep domain and implementation understanding. In this paper, we propose a novel approach to classify test inputs and their dependencies automatically. Firstly, random (or automatically generated) input vectors are sent to the system under test (SUT). For each input vector, an observed “hit vector” is produced by monitoring the execution of the SUT. Secondly, hit vectors are grouped into clusters using machine learning. Each cluster contains similar hit vectors, i.e., similar behaviors, and from them we obtain corresponding clusters of input vectors. Input classes are then extracted for each input parameter straightforwardly. Our experiments with a number of subjects show good results as the automatically generated classifications are the same or very close to the expected ones.
Keywords :
inference mechanisms; learning (artificial intelligence); pattern classification; program testing; reverse engineering; SUT; automated inference; combinatorial testing; deep domain understanding; disjoint equivalence classes; hit vector; implementation understanding; input class combinations; input classification; input parameter; machine learning; pairwise coverage; partition testing; system under test; Clustering algorithms; Concrete; Servers; Support vector machine classification; Systematics; Testing; Vectors; Automated input classifications; combinatorial testing; invariant inference;
Conference_Titel :
Automated Software Engineering (ASE), 2013 IEEE/ACM 28th International Conference on
Conference_Location :
Silicon Valley, CA
DOI :
10.1109/ASE.2013.6693123