Title :
Breakthrough in trade-off between threshold voltage and specific on-resistance of SiC-MOSFETs
Author :
Furuhashi, Masayuki ; Tanioka, Toshikazu ; Ebiike, Yuji ; Suekawa, Eisuke ; Tarui, Yoichiro ; Sakai, Shinji ; Yutani, Naoki ; Miura, Naruhisa ; Imaizumi, Masayuki ; Yamakawa, Satoshi ; Oomori, Tatsuo
Author_Institution :
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Amagasaki, Japan
Abstract :
The threshold voltage of 4H-SiC MOSFET increases drastically by performing wet oxidation after nitridation of gate oxide without significant decrease in the channel effective mobility. The increment of the threshold voltage depends on the wet oxidation conditions, and wet oxidation improves the trade-off between the threshold voltage and the specific on-resistance. We fabricated 600 V 4H-SiC MOSFETs with a threshold voltage of 5.11 V and a specific on-resistance of 5.2 mΩcm2 using the procedure above. The stability of the threshold voltage for the SiC-MOSFETs was confirmed by a HTGB test.
Keywords :
MOSFET; nitridation; oxidation; semiconductor device testing; silicon compounds; wetting; wide band gap semiconductors; HTGB test; MOSFET; SiC; channel effective mobility; nitridation; specific on-resistance; stability; threshold voltage stability; voltage 5.11 V; voltage 600 V; wet oxidation; Logic gates; MOSFET; Oxidation; Silicon carbide; Temperature measurement; Threshold voltage; Voltage measurement;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
Conference_Location :
Kanazawa
Print_ISBN :
978-1-4673-5134-8
DOI :
10.1109/ISPSD.2013.6694397