Title :
Vertical power diodes in bulk GaN
Author :
Disney, Don ; Hui Nie ; Edwards, Andrew ; Bour, David ; Shah, Hemal ; Kizilyalli, Isik C.
Author_Institution :
Avogy, Inc., San Jose, CA, USA
Abstract :
Vertical diodes with breakdown voltages up to 2.6kV have been fabricated on bulk GaN substrates. The measured figures-of-merit of these devices show performance near the theoretical limit of GaN. These vertical GaN diodes exhibit robust avalanche breakdown behavior with a positive temperature coefficient. System-level performance advantages have been demonstrated in power conversion applications. Statistical data have been collected from thousands of devices. Initial reliability tests have been completed.
Keywords :
III-V semiconductors; gallium compounds; power semiconductor diodes; semiconductor device breakdown; semiconductor device reliability; wide band gap semiconductors; GaN; PN diodes; positive temperature coefficient; power conversion applications; reliability tests; robust avalanche breakdown behavior; statistical data; system-level performance; vertical power diodes; Gallium nitride; Light emitting diodes; Performance evaluation; Semiconductor diodes; Silicon; Silicon carbide; Substrates;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
Conference_Location :
Kanazawa
Print_ISBN :
978-1-4673-5134-8
DOI :
10.1109/ISPSD.2013.6694455