Title : 
GaN HEMTs power module package design and performance evaluation
         
        
            Author : 
Chung-Hsiang Ho ; Po-Chien Chou ; Cheng, Stone
         
        
            Author_Institution : 
Dept. of Mech. Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
         
        
        
        
        
        
            Abstract : 
This paper described the electronic performance of power module packaged high-power AlGaN/GaN high electron mobility transistors (HEMTs) on silicon substrate. Sixteen GaN chips are mounted on one AlN substrate. There are three AlN substrate in one module. Each device is wire-bonded in parallel connection to increase the power rating. Both DC and pulsed current-voltage (ID-VDS) characteristics are measured for different connection and sizes of devices, at various of power densities, pulse lengths, and duty factors. We found some conditions that makes the parallel connection difference down to zero. According that, The GaN has maxima drain current=5.98A(98.8%).
         
        
            Keywords : 
III-V semiconductors; aluminium compounds; elemental semiconductors; gallium compounds; high electron mobility transistors; semiconductor device packaging; silicon; wide band gap semiconductors; AlGaN-GaN; HEMT power module package design; ID-VDS; Si; dc characteristics; duty factors; high-power high electron mobility transistors; parallel connection; performance evaluation; power densities; power rating; pulse lengths; pulsed current-voltage characteristics; silicon substrate; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; MODFETs; Performance evaluation; Resistance;
         
        
        
        
            Conference_Titel : 
Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
         
        
            Conference_Location : 
Kanazawa
         
        
        
            Print_ISBN : 
978-1-4673-5134-8
         
        
        
            DOI : 
10.1109/ISPSD.2013.6694468