• DocumentCode
    661603
  • Title

    GaN HEMTs power module package design and performance evaluation

  • Author

    Chung-Hsiang Ho ; Po-Chien Chou ; Cheng, Stone

  • Author_Institution
    Dept. of Mech. Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
  • fYear
    2013
  • fDate
    26-30 May 2013
  • Firstpage
    297
  • Lastpage
    299
  • Abstract
    This paper described the electronic performance of power module packaged high-power AlGaN/GaN high electron mobility transistors (HEMTs) on silicon substrate. Sixteen GaN chips are mounted on one AlN substrate. There are three AlN substrate in one module. Each device is wire-bonded in parallel connection to increase the power rating. Both DC and pulsed current-voltage (ID-VDS) characteristics are measured for different connection and sizes of devices, at various of power densities, pulse lengths, and duty factors. We found some conditions that makes the parallel connection difference down to zero. According that, The GaN has maxima drain current=5.98A(98.8%).
  • Keywords
    III-V semiconductors; aluminium compounds; elemental semiconductors; gallium compounds; high electron mobility transistors; semiconductor device packaging; silicon; wide band gap semiconductors; AlGaN-GaN; HEMT power module package design; ID-VDS; Si; dc characteristics; duty factors; high-power high electron mobility transistors; parallel connection; performance evaluation; power densities; power rating; pulse lengths; pulsed current-voltage characteristics; silicon substrate; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; MODFETs; Performance evaluation; Resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
  • Conference_Location
    Kanazawa
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4673-5134-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.2013.6694468
  • Filename
    6694468