DocumentCode
661603
Title
GaN HEMTs power module package design and performance evaluation
Author
Chung-Hsiang Ho ; Po-Chien Chou ; Cheng, Stone
Author_Institution
Dept. of Mech. Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
fYear
2013
fDate
26-30 May 2013
Firstpage
297
Lastpage
299
Abstract
This paper described the electronic performance of power module packaged high-power AlGaN/GaN high electron mobility transistors (HEMTs) on silicon substrate. Sixteen GaN chips are mounted on one AlN substrate. There are three AlN substrate in one module. Each device is wire-bonded in parallel connection to increase the power rating. Both DC and pulsed current-voltage (ID-VDS) characteristics are measured for different connection and sizes of devices, at various of power densities, pulse lengths, and duty factors. We found some conditions that makes the parallel connection difference down to zero. According that, The GaN has maxima drain current=5.98A(98.8%).
Keywords
III-V semiconductors; aluminium compounds; elemental semiconductors; gallium compounds; high electron mobility transistors; semiconductor device packaging; silicon; wide band gap semiconductors; AlGaN-GaN; HEMT power module package design; ID-VDS; Si; dc characteristics; duty factors; high-power high electron mobility transistors; parallel connection; performance evaluation; power densities; power rating; pulse lengths; pulsed current-voltage characteristics; silicon substrate; Aluminum gallium nitride; Gallium nitride; HEMTs; Logic gates; MODFETs; Performance evaluation; Resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
Conference_Location
Kanazawa
ISSN
1943-653X
Print_ISBN
978-1-4673-5134-8
Type
conf
DOI
10.1109/ISPSD.2013.6694468
Filename
6694468
Link To Document