• DocumentCode
    661611
  • Title

    A new type of SiC-VJFET with extreme low feedback capacitance

  • Author

    Ishikawa, Tsuyoshi ; Nomura, Katsuya ; Sugiyama, Takahide ; Uesugi, Tsutomu ; Nishikawa, Koichi

  • Author_Institution
    Electron. Devices Res. Div., Toyota Central R&D Labs., Inc., Nagakute, Japan
  • fYear
    2013
  • fDate
    26-30 May 2013
  • Firstpage
    183
  • Lastpage
    186
  • Abstract
    In this paper, we propose a novel SiC vertical JFET (VJFET) with low feedback capacitance Crss by using a device simulator. A key feature of the proposed VJFET is the p+ screen grid inserted between gate and drain electrode. The screen grid is effective to reduce the Crss by 80% compared to conventional VJFETs. Due to the low Crss, total power loss of the proposed VJFET is the lowest among existing SiC power devices. This new VJFET can be a promising candidate for a high-speed and low-loss SiC power device.
  • Keywords
    capacitance; junction gate field effect transistors; power field effect transistors; silicon compounds; wide band gap semiconductors; SiC; SiC-VJFET; device simulator; extreme low feedback capacitance; p+ screen grid; vertical JFET; Capacitance; JFETs; Logic gates; MOSFET; Silicon carbide; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs (ISPSD), 2013 25th International Symposium on
  • Conference_Location
    Kanazawa
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4673-5134-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.2013.6694476
  • Filename
    6694476