• DocumentCode
    662064
  • Title

    Approximation for measuring complex material parameters at λ/2 resonances in transmission-line measurements

  • Author

    Sung Kim ; Baker-Jarvis, James

  • Author_Institution
    Electromagn. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • fYear
    2013
  • fDate
    5-8 Nov. 2013
  • Firstpage
    803
  • Lastpage
    805
  • Abstract
    We propose an approximation for removing resonant artifacts that arise in permittivity and permeability measurements when using the transmission/reflection (T/R) method at frequencies where the test sample length is an integer multiple of a half wavelength. In order to address this issue, we approximate the input impedance of the transmission-line fixture around the λ/2 resonance with a simple algorithm based on a 1st-order regression. The characteristic impedance of the sample-loaded section of the fixture is computed from those regression coefficients, and the permittivity and permeability can be computed by assuming that the refractive index obtained from the conventional T/R method does not suffer from resonant artifacts. Our approximate results are validated when compared with those from one of the conventional T/R methods, the Nicolson-Ross-Weir (NRW) method.
  • Keywords
    high-frequency transmission lines; magnetic permeability measurement; permittivity measurement; regression analysis; λ/2 resonances; 1st-order regression; complex material parameters; permeability; permittivity; refractive index; resonant artifacts; transmission-line measurements; transmission/reflection method; Approximation methods; Impedance; Materials; Permeability; Permittivity; Resonant frequency; Transmission line measurements; half-wavelength resonance; low-loss material; permeability; permittivity; transmission/reflection (T/R) method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference Proceedings (APMC), 2013 Asia-Pacific
  • Conference_Location
    Seoul
  • Type

    conf

  • DOI
    10.1109/APMC.2013.6694938
  • Filename
    6694938