DocumentCode :
662064
Title :
Approximation for measuring complex material parameters at λ/2 resonances in transmission-line measurements
Author :
Sung Kim ; Baker-Jarvis, James
Author_Institution :
Electromagn. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
2013
fDate :
5-8 Nov. 2013
Firstpage :
803
Lastpage :
805
Abstract :
We propose an approximation for removing resonant artifacts that arise in permittivity and permeability measurements when using the transmission/reflection (T/R) method at frequencies where the test sample length is an integer multiple of a half wavelength. In order to address this issue, we approximate the input impedance of the transmission-line fixture around the λ/2 resonance with a simple algorithm based on a 1st-order regression. The characteristic impedance of the sample-loaded section of the fixture is computed from those regression coefficients, and the permittivity and permeability can be computed by assuming that the refractive index obtained from the conventional T/R method does not suffer from resonant artifacts. Our approximate results are validated when compared with those from one of the conventional T/R methods, the Nicolson-Ross-Weir (NRW) method.
Keywords :
high-frequency transmission lines; magnetic permeability measurement; permittivity measurement; regression analysis; λ/2 resonances; 1st-order regression; complex material parameters; permeability; permittivity; refractive index; resonant artifacts; transmission-line measurements; transmission/reflection method; Approximation methods; Impedance; Materials; Permeability; Permittivity; Resonant frequency; Transmission line measurements; half-wavelength resonance; low-loss material; permeability; permittivity; transmission/reflection (T/R) method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings (APMC), 2013 Asia-Pacific
Conference_Location :
Seoul
Type :
conf
DOI :
10.1109/APMC.2013.6694938
Filename :
6694938
Link To Document :
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