DocumentCode
662064
Title
Approximation for measuring complex material parameters at λ/2 resonances in transmission-line measurements
Author
Sung Kim ; Baker-Jarvis, James
Author_Institution
Electromagn. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear
2013
fDate
5-8 Nov. 2013
Firstpage
803
Lastpage
805
Abstract
We propose an approximation for removing resonant artifacts that arise in permittivity and permeability measurements when using the transmission/reflection (T/R) method at frequencies where the test sample length is an integer multiple of a half wavelength. In order to address this issue, we approximate the input impedance of the transmission-line fixture around the λ/2 resonance with a simple algorithm based on a 1st-order regression. The characteristic impedance of the sample-loaded section of the fixture is computed from those regression coefficients, and the permittivity and permeability can be computed by assuming that the refractive index obtained from the conventional T/R method does not suffer from resonant artifacts. Our approximate results are validated when compared with those from one of the conventional T/R methods, the Nicolson-Ross-Weir (NRW) method.
Keywords
high-frequency transmission lines; magnetic permeability measurement; permittivity measurement; regression analysis; λ/2 resonances; 1st-order regression; complex material parameters; permeability; permittivity; refractive index; resonant artifacts; transmission-line measurements; transmission/reflection method; Approximation methods; Impedance; Materials; Permeability; Permittivity; Resonant frequency; Transmission line measurements; half-wavelength resonance; low-loss material; permeability; permittivity; transmission/reflection (T/R) method;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference Proceedings (APMC), 2013 Asia-Pacific
Conference_Location
Seoul
Type
conf
DOI
10.1109/APMC.2013.6694938
Filename
6694938
Link To Document