DocumentCode :
66224
Title :
Schedule Restoration for Single-Armed Cluster Tools
Author :
Ja-Hee Kim ; Mengchu Zhou ; Tae-Eog Lee
Author_Institution :
Grad. Sch. of Public Policy & Inf. Technol., SeoulTech, Seoul, South Korea
Volume :
27
Issue :
3
fYear :
2014
fDate :
Aug. 2014
Firstpage :
388
Lastpage :
399
Abstract :
The idle time between two consecutive tasks may seriously affect the wafer quality in some wafer fabrication processes requiring high temperature and pressure. Hence, a cluster tool provides high wafer quality and predictability when operated at a steady schedule, which means that every cycle repeats the same pattern considering not only a sequence but also timing. However, multiple process modules per step can cause the fluctuation of wafer quality even under the same sequence since different modules have different wafer delays. It is known that a dual-armed cluster tool can always have a steady schedule that can be established via a timed event graph and (max, +) algebra. We extend this result to a single-armed cluster tool and generalize the method to establish its steady schedule. Although a cluster tool is initially set on a steady schedule, the schedule can become unsteady after disruptive events, such as wafer alignment failures, and it cannot always return to it. We develop strategies that change the system dynamics of a cluster tool by appropriately delaying some tasks such that any disrupted schedule pattern is stabilized in a finite time. Finally, we examine how they help to flatten wafer delays after a disruption or when tasks have stochastic time fluctuation.
Keywords :
algebra; graph theory; quality control; scheduling; semiconductor device manufacture; stochastic processes; algebra; cluster tool system dynamics; disrupted schedule pattern; disruptive events; dual-armed cluster tool; finite time; schedule restoration; semiconductor manufacturing; single-armed cluster tool; stability; stochastic time fluctuation; timed event graph; wafer alignment failures; wafer fabrication processes; wafer quality; Algebra; Delays; Mathematical model; Robots; Schedules; Stability analysis; (max,+); Cluster tool; Petri nets; algebra; discrete event systems; scheduling;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2014.2315871
Filename :
6783972
Link To Document :
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