High frequency scattering analysis of dielectric surfaces: TM incidence case

Author

An Nguyen Ngoc ; Shirai, Hiroshi

Author_Institution

Grad. Sch. of Sci. & Eng., Chuo Univ., Tokyo, Japan

fYear

2013

fDate

5-8 Nov. 2013

Firstpage

294

Lastpage

296

Abstract

Electromagnetic TM polarized plane wave scattering by dielectric surfaces is analyzed by high frequency asymptotic method. The scattering field is estimated from the equivalent currents induced by reflected plane wave on the dielectric surface. Effects of material nature, polarization and finiteness of the dielectric bodies are included in a multiple reflection coefficient. A comparison between theoretical estimations and measurement in the case of a rubber cube suggests a strong connection between the thickness of the body and its RCS values.

Keywords

dielectric bodies; electromagnetic wave polarisation; electromagnetic wave reflection; electromagnetic wave scattering; TM incidence case; dielectric surface; electromagnetic TM polarization; high frequency asymptotic method; high frequency scattering analysis; multiple reflection coefficient; plane wave scattering; rubber cube; Dielectrics; Optical surface waves; Reflection coefficient; Scattering; Surface impedance; Surface waves; Vectors; Kirchhoff approximation; RCS; dielectric bodies; equivalent currents; multiple reflection;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference Proceedings (APMC), 2013 Asia-Pacific

Conference_Location

Seoul

Type

conf

DOI

10.1109/APMC.2013.6695124

Filename

6695124