DocumentCode
662671
Title
Normally-off GaN switching 400V in 1.4ns using an ultra-low resistance and inductance gate drive
Author
Hughes, Brian ; Rongming Chu ; Lazar, Josef ; Hulsey, Stephen ; Garrido, Austin ; Zehnder, Daniel ; Musni, Marcel ; Boutros, Karim
Author_Institution
HRL Labs. LLC, Malibu, CA, USA
fYear
2013
fDate
27-29 Oct. 2013
Firstpage
76
Lastpage
79
Abstract
A turn-on time of 1.4ns is measured in a normally-off GaN synchronous boost converter switching 400V. The high-speed performance is achieved by significantly improving the GaN switches, packaging and gate drive. A recently developed normally-off, AlN-based insulating-gate, AlGaN/GaN-on-Si HFET operates with a high gate voltage of 6V [1]. The higher gate voltage increases gate current for faster switching. A Multi-Chip-Module (MCM) allows paralleling GaN switch up to 20Arms with low parasitic inductance of ~ 3.6nH in the power loop. The gate drive uses 50mΩ bare MOSFETs integrated onto the MCM to significantly reduce gate driver inductance to 1nH. The very fast switching results in large drain undershoot of 200V, and gate overshoot of more than 6V. Increasing the gate turn-on resistance to 1.4Ω eliminates gate voltage overshoot and reduces drain voltage overshoot to ~20V, at the cost of an increased turn-on time of 3ns.
Keywords
III-V semiconductors; aluminium compounds; elemental semiconductors; gallium compounds; multichip modules; power HEMT; silicon; switching convertors; wide band gap semiconductors; AIGaN/GaN-on-Si HFET; AIN-based insulating-gate HFET; AlN-AlGaN-GaN-Si; bare MOSFET; gate current; gate voltage; high-speed performance; inductance gate drive; multichip-module; normally-off GaN synchronous boost converter switching; packaging; parasitic inductance; time 1.4 ns; ultra-low resistance; voltage 400 V; voltage 6 V; Gallium nitride; HEMTs; Laboratories; Logic gates; MODFETs; Silicon; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Wide Bandgap Power Devices and Applications (WiPDA), 2013 IEEE Workshop on
Conference_Location
Columbus, OH
Type
conf
DOI
10.1109/WiPDA.2013.6695566
Filename
6695566
Link To Document