• DocumentCode
    662701
  • Title

    The impact of parallel GaN HEMTs on efficiency of a 12-to-1 V buck converter

  • Author

    Jenkins, Luke L. ; Wilson, Christopher G. ; Moses, Justin D. ; Aggas, Jeffrey M. ; Rhea, Benjamin K. ; Dean, Robert N.

  • Author_Institution
    Electr. & Comput. Eng. Dept., Auburn Univ., Auburn, AL, USA
  • fYear
    2013
  • fDate
    27-29 Oct. 2013
  • Firstpage
    197
  • Lastpage
    200
  • Abstract
    The impact of parallel GaN HEMTs on efficiency of a non-isolated point of load (POL) converter is investigated. The test results indicate how many parallel GaN HEMTs should be used to achieve maximum efficiency based on load current. Loss calculations and simulations provided initial direction, and ten POL converters were tested-only varying the number of paralleled GaN HEMTs. Each design was tested between 2.5 and 30 A output. Depending on application load and frequency, the optimal combination of GaN HEMTs can be derived from this data. Results indicate that above 19.5 A load, two EPC2015 switches and four EPC2015 synchronous rectifiers (referred to as 2×2015/4×2015) minimizes loss. Below 19.5 A load, a 1×2015/2×2015 HEMT combination minimizes loss. Results presented here should expedite the design process for future engineers seeking greater power supply efficiency with GaN transistors, and it provides novel test data over a large load spectrum, variety of frequencies, and ten combinations of GaN HEMTs in a non-isolated POL converter.
  • Keywords
    III-V semiconductors; field effect transistor switches; gallium compounds; high electron mobility transistors; power convertors; rectifiers; wide band gap semiconductors; EPC2015 switches; EPC2015 synchronous rectifiers; GaN; buck converter; current 2.5 A to 30 A; nonisolated point of load converter; parallel GaN HEMT; voltage 12 V to 1 V; Frequency conversion; Gallium nitride; HEMTs; MODFETs; Power conversion; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wide Bandgap Power Devices and Applications (WiPDA), 2013 IEEE Workshop on
  • Conference_Location
    Columbus, OH
  • Type

    conf

  • DOI
    10.1109/WiPDA.2013.6695596
  • Filename
    6695596