Title :
Differential entropy feature for EEG-based emotion classification
Author :
Ruo-Nan Duan ; Jia-Yi Zhu ; Bao-Liang Lu
Author_Institution :
Dept. of Comput. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
EEG-based emotion recognition has been studied for a long time. In this paper, a new effective EEG feature named differential entropy is proposed to represent the characteristics associated with emotional states. Differential entropy (DE) and its combination on symmetrical electrodes (Differential asymmetry, DASM; and rational asymmetry, RASM) are compared with traditional frequency domain feature (energy spectrum, ES). The average classification accuracies using features DE, DASM, RASM, and ES on EEG data collected in our experiment are 84.22%, 80.96%, 83.28%, and 76.56%, respectively. This result indicates that DE is more suited for emotion recognition than traditional feature, ES. It is also confirmed that EEG signals on frequency band Gamma relates to emotional states more closely than other frequency bands. Feature smoothing method- linear dynamical system (LDS), and feature selection algorithm- minimal-redundancy-maximal-relevance (MRMR) algorithm also help to increase the accuracies and efficiencies of EEG-based emotion classifiers.
Keywords :
biomedical electrodes; electroencephalography; emotion recognition; entropy; feature extraction; feature selection; medical signal processing; signal classification; smoothing methods; DASM; DE; EEG signals; EEG-based emotion classification; EEG-based emotion recognition; ES; LDS; MRMR algorithm; RASM; differential asymmetry; differential entropy feature; emotional states; energy spectrum; feature selection algorithm; feature smoothing method; frequency domain feature; linear dynamical system; minimal-redundancy-maximal-relevance algorithm; rational asymmetry; symmetrical electrodes; Accuracy; Brain modeling; Electroencephalography; Emotion recognition; Motion pictures; Smoothing methods; Support vector machines;
Conference_Titel :
Neural Engineering (NER), 2013 6th International IEEE/EMBS Conference on
Conference_Location :
San Diego, CA
DOI :
10.1109/NER.2013.6695876