DocumentCode :
663052
Title :
Specific absorption rate in a standard phantom containing a Deep Brain Stimulation lead at 3 Tesla MRI
Author :
Bonmassar, Giorgio ; Serano, Peter ; Angelone, Leonardo M.
Author_Institution :
Med. Sch., Dept. of Radiol., Harvard Univ., Charlestown, MA, USA
fYear :
2013
fDate :
6-8 Nov. 2013
Firstpage :
747
Lastpage :
750
Abstract :
Finite elements methods (FEM) simulations are presented showing the specific absorption rate (SAR) distribution in the case of a Deep Brain Stimulation (DBS) lead inside a standard phantom exposed to 128 MHz / 3 Tesla magnetic resonance imaging (MRI). The electromagnetic model is proposed as a tool to study the safety of patients with an implanted DBS lead undergoing clinical 3T MRI systems. The simulations were based on an electromagnetic and circuit co-simulation methodology and allowed for fine tuning of the MRI radiofrequency transmit body coil. Results show that the presence of the lead did not influence the behavior of the coil, namely the S-parameters at the coil feed were largely unaffected by the presence of a lead. Conversely, significant changes of electric and magnetic field, as well as local SAR were observed due to the characteristic antenna effect. The lead path strongly affected the level of SAR at the distal tip of the lead, with a 10x fold difference between the two configurations evaluated.
Keywords :
S-parameters; bioelectric potentials; biomagnetism; biomedical MRI; circuit simulation; coils; finite element analysis; phantoms; surgery; FEM; MRI; MRI radiofrequency transmit body coil; S-parameters; characteristic antenna effect; circuit cosimulation methodology; coil feed; deep brain stimulation lead; distal tip; electromagnetic cosimulation methodology; finite elements methods; frequency 128 MHz; magnetic flux density 3 T; magnetic resonance imaging; specific absorption rate; standard phantom; Coils; Implants; Integrated circuit modeling; Magnetic resonance imaging; Phantoms; Radio frequency; Satellite broadcasting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Engineering (NER), 2013 6th International IEEE/EMBS Conference on
Conference_Location :
San Diego, CA
ISSN :
1948-3546
Type :
conf
DOI :
10.1109/NER.2013.6696042
Filename :
6696042
Link To Document :
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