• DocumentCode
    663206
  • Title

    Effects of ocular artifact removal through ICA decomposition on EEG phase

  • Author

    Montefusco-Siegmund, Rodrigo ; Maldonado, Pedro E. ; Devia, Christ

  • Author_Institution
    Dept. of Psychol., York Univ., Toronto, ON, Canada
  • fYear
    2013
  • fDate
    6-8 Nov. 2013
  • Firstpage
    1374
  • Lastpage
    1377
  • Abstract
    Neurophysiological data are widely affected by different forms of signal artifacts. In electroencephalographic recordings from the scalp, eye blinks are a main contribution as a source of signal alteration. Different approaches have been used to improve on this problem, from the rejection of part of the signal, to corrections through linear decomposition methods. A widely used technique is independent component analysis (ICA). Different studies have shown the suitability of ICA to correct a variety of artifact sources, but to our knowledge, there is no evidence of the effect of ICA in the phase of a signal, over time. This is of importance because the phase is a critical component of the physiological signals that has been implicated in several neural mechanisms. The aim of this work is to assess the level of phase distortion that ICA can potentially introduce to real and simulated data.
  • Keywords
    electroencephalography; eye; independent component analysis; medical signal processing; neurophysiology; signal denoising; EEG phase; ICA decomposition; ICA suitability; artifact source correction; electroencephalographic recording; eye blinking; independent component analysis; linear decomposition method; neural mechanism; neurophysiological data; ocular artifact removal; phase distortion level; physiological signal; real data; scalp; signal alteration; signal artifact; signal phase; signal rejection; simulated data; Algorithm design and analysis; Coherence; Electrodes; Electroencephalography; Independent component analysis; Scalp; Time-frequency analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Engineering (NER), 2013 6th International IEEE/EMBS Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1948-3546
  • Type

    conf

  • DOI
    10.1109/NER.2013.6696198
  • Filename
    6696198