• DocumentCode
    6637
  • Title

    Automated High-Ohmic Resistance Bridge With Voltage and Current Null Detection

  • Author

    Rietveld, Gert ; van der Beek, J.H.N.

  • Author_Institution
    VSL, Dutch Nat. Metrol. Inst., Delft, Netherlands
  • Volume
    62
  • Issue
    6
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    1760
  • Lastpage
    1765
  • Abstract
    A high-ohmic bridge for automated resistance measurements in the range between 1 MΩ and up to and above 100 TΩ is described. Whereas similar setups reported so far use only current null detection, the present system developed at VSL can use either voltage or current null detection. We compare the two null detection methods and find no significant difference between the methods over the resistance range between 10 MΩ and 100 GΩ. Voltage null detection is more accurate for resistance values below 10 GΩ at 10 V measurement voltage, whereas for resistance measurements above 100 GΩ current null detection should be used. Careful automation and refinement of the measurement procedure lead to excellent results and uncertainties. For example, the measurement of the 1:100 ratio of the series and parallel connection of a 10 × 100 MΩ Hamon device agrees within (0.5 ± 0.4)μΩ/Ω with the nominal Hamon ratio. The total measurement uncertainty at 1 GΩ equals 1.7 μΩ/Ω (k = 1), which has been confirmed in a recent international comparison.
  • Keywords
    electric current measurement; electric resistance measurement; electric sensing devices; measurement uncertainty; voltage measurement; Hamon device; VSL; automated high-ohmic resistance bridge; automated resistance measurement; current null detection method; measurement uncertainty; resistance 10 Mohm to 100 Gohm; voltage 10 V; voltage null detection method; High-ohmic measurement; null detector resistance; resistance measurements; resistors; small currents; standard; transfer standard;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2013.2250171
  • Filename
    6493440