DocumentCode :
6637
Title :
Automated High-Ohmic Resistance Bridge With Voltage and Current Null Detection
Author :
Rietveld, Gert ; van der Beek, J.H.N.
Author_Institution :
VSL, Dutch Nat. Metrol. Inst., Delft, Netherlands
Volume :
62
Issue :
6
fYear :
2013
fDate :
Jun-13
Firstpage :
1760
Lastpage :
1765
Abstract :
A high-ohmic bridge for automated resistance measurements in the range between 1 MΩ and up to and above 100 TΩ is described. Whereas similar setups reported so far use only current null detection, the present system developed at VSL can use either voltage or current null detection. We compare the two null detection methods and find no significant difference between the methods over the resistance range between 10 MΩ and 100 GΩ. Voltage null detection is more accurate for resistance values below 10 GΩ at 10 V measurement voltage, whereas for resistance measurements above 100 GΩ current null detection should be used. Careful automation and refinement of the measurement procedure lead to excellent results and uncertainties. For example, the measurement of the 1:100 ratio of the series and parallel connection of a 10 × 100 MΩ Hamon device agrees within (0.5 ± 0.4)μΩ/Ω with the nominal Hamon ratio. The total measurement uncertainty at 1 GΩ equals 1.7 μΩ/Ω (k = 1), which has been confirmed in a recent international comparison.
Keywords :
electric current measurement; electric resistance measurement; electric sensing devices; measurement uncertainty; voltage measurement; Hamon device; VSL; automated high-ohmic resistance bridge; automated resistance measurement; current null detection method; measurement uncertainty; resistance 10 Mohm to 100 Gohm; voltage 10 V; voltage null detection method; High-ohmic measurement; null detector resistance; resistance measurements; resistors; small currents; standard; transfer standard;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2013.2250171
Filename :
6493440
Link To Document :
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