DocumentCode
664451
Title
Characterizing the in-phase reflection bandwidth theoretical limit of artificial magnetic conductors with transmission line model
Author
Yunsong Xie ; Xin Fan ; Yunpeng Chen ; Wilson, Jared D. ; Simons, Rainee N. ; Xiao, John Q.
Author_Institution
Dept. of Phys. & Astron., Univ. of Delaware, Newark, DE, USA
fYear
2013
fDate
2-7 June 2013
Firstpage
1
Lastpage
4
Abstract
We validate through simulation and experiment that artificial magnetic conductors (AMC´s) can be well characterized by a transmission line model. The theoretical bandwidth limit of the in-phase reflection can be expressed in terms of the effective RLC parameters from the surface patch and the properties of the substrate. It is found that the existence of effective inductive components will reduce the in-phase reflection bandwidth of the AMC. Furthermore, we propose design strategies to optimize AMC structures with an in-phase reflection bandwidth closer to the theoretical limit.
Keywords
RLC circuits; conductors (electric); reflection; transmission lines; AMC structures; artificial magnetic conductors; effective RLC parameters; in-phase reflection bandwidth theoretical limit; inductive components; transmission line model; Antenna measurements; Bandwidth; Conductors; Impedance; Reflection; Substrates; Surface impedance; Surface impedance; transmission line matrix methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location
Seattle, WA
ISSN
0149-645X
Print_ISBN
978-1-4673-6177-4
Type
conf
DOI
10.1109/MWSYM.2013.6697460
Filename
6697460
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