• DocumentCode
    664451
  • Title

    Characterizing the in-phase reflection bandwidth theoretical limit of artificial magnetic conductors with transmission line model

  • Author

    Yunsong Xie ; Xin Fan ; Yunpeng Chen ; Wilson, Jared D. ; Simons, Rainee N. ; Xiao, John Q.

  • Author_Institution
    Dept. of Phys. & Astron., Univ. of Delaware, Newark, DE, USA
  • fYear
    2013
  • fDate
    2-7 June 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We validate through simulation and experiment that artificial magnetic conductors (AMC´s) can be well characterized by a transmission line model. The theoretical bandwidth limit of the in-phase reflection can be expressed in terms of the effective RLC parameters from the surface patch and the properties of the substrate. It is found that the existence of effective inductive components will reduce the in-phase reflection bandwidth of the AMC. Furthermore, we propose design strategies to optimize AMC structures with an in-phase reflection bandwidth closer to the theoretical limit.
  • Keywords
    RLC circuits; conductors (electric); reflection; transmission lines; AMC structures; artificial magnetic conductors; effective RLC parameters; in-phase reflection bandwidth theoretical limit; inductive components; transmission line model; Antenna measurements; Bandwidth; Conductors; Impedance; Reflection; Substrates; Surface impedance; Surface impedance; transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
  • Conference_Location
    Seattle, WA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4673-6177-4
  • Type

    conf

  • DOI
    10.1109/MWSYM.2013.6697460
  • Filename
    6697460