Title : 
A 40-dBm high voltage broadband GaN Class-J power amplifier for PoE micro-basestations
         
        
            Author : 
Rui Ma ; Goswami, Suparna ; Yamanaka, Keiji ; Komatsuzaki, Yuji ; Ohta, Atsushi
         
        
            Author_Institution : 
Mitsubishi Electr. Res. Labs., Cambridge, MA, USA
         
        
        
        
        
        
            Abstract : 
A broadband, efficient and linear RF power amplifier for 4G multi-standard micro-basestations is presented. With an optimized Class-J matching network and a new commercially available high voltage 10W GaN HEMT, output power around 40.5dBm is measured across 1.65-2.70GHz with 55-72% drain efficiency at 1-dB compression point under CW stimulus. Using a 20MHz modulated test signal at 2.5GHz with 9.5dB PAPR, high average efficiency of 48% was measured at 35.9dBm average output power, with ACPR better than -30dBc. To the author´s best knowledge, this is the first Class-J prototype operating at 47V, enabling power over ethernet applications without any external voltage regulation, thereby further reducing bill of materials and improving the overall system efficiency.
         
        
            Keywords : 
III-V semiconductors; gallium compounds; high electron mobility transistors; microwave power amplifiers; voltage control; wide band gap semiconductors; 4G multistandard microbases tations; Ethernet; GaN HEMT; GaN power amplifier; PoE microbase stations; broadband power amplifier; class-J matching network; class-J power amplifier; class-J prototype; high voltage power amplifier; linear RF power amplifier; voltage regulation; Bandwidth; Broadband amplifiers; Gallium nitride; Harmonic analysis; Power amplifiers; Power generation; Gallium Nitride HEMT; Multi-standard; Power amplifier; Power over Ethernet (PoE); Transmitter;
         
        
        
        
            Conference_Titel : 
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
         
        
            Conference_Location : 
Seattle, WA
         
        
        
            Print_ISBN : 
978-1-4673-6177-4
         
        
        
            DOI : 
10.1109/MWSYM.2013.6697607