DocumentCode
664692
Title
A hierarchical domain decomposition method for rigorous conductor modeling of signal integrity in multi-scale integrated circuits
Author
Yang Shao ; Zhen Peng ; Jin-Fa Lee
Author_Institution
ElectroScience Lab., Ohio State Univ. Columbus, Columbus, OH, USA
fYear
2013
fDate
2-7 June 2013
Firstpage
1
Lastpage
4
Abstract
We present a hierarchical multi-solver domain decomposition method to accurately analyzing the signal integrity problems in multi-scale integrated circuits. Particularly, we discuss in detail a 3-D full wave method to model the conductor loss due to finite conductivities in metals. The proposed multi-solver non-conformal domain decomposition method follows a hierarchical domain partitioning strategy and the original problem is decomposed into non-overlapping subregions. A finite element domain decomposition method is adopted for the dielectric subregion with complex geometries and non-uniform material properties. While for the conductor subregion, a surface integral equation domain decomposition method is applied. To further improve the convergence in the DDM iterations, optimized transmission conditions are introduced to enforce the field continuities across sub-domain interfaces. Moreover, a hierarchical multi-level fast multiple method is adopted to address the low frequency issues particularly in IC applications. Rigorous numerical experiments validate the potential benefits offered by the proposed method.
Keywords
conductors (electric); finite element analysis; integral equations; integrated circuit modelling; integrated circuit packaging; 3-D full wave method; finite element domain decomposition method; finite metal conductivities; hierarchical domain partitioning strategy; hierarchical multilevel fast multiple method; hierarchical multisolver domain decomposition method; multiscale integrated circuits; rigorous conductor modeling; signal integrity; surface integral equation domain decomposition method; Computational modeling; Conductors; Dielectrics; Integral equations; Integrated circuit modeling; Microstrip; Signal integrity; conductor loss; generalized combined field integral equation; multi-solver domain decomposition method; surface integral equation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location
Seattle, WA
ISSN
0149-645X
Print_ISBN
978-1-4673-6177-4
Type
conf
DOI
10.1109/MWSYM.2013.6697703
Filename
6697703
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