DocumentCode
664781
Title
Microwave cavity perturbation technique for high-temperature dielectric measurements
Author
Soldatov, Sergey ; Kayser, T. ; Link, G. ; Seitz, T. ; Layer, Stefan ; Jelonnek, John
Author_Institution
IHM, Karlsruhe, Germany
fYear
2013
fDate
2-7 June 2013
Firstpage
1
Lastpage
4
Abstract
The present work is motivated by the use of microwaves for the catalytic conversion of carbon dioxide to carbon monoxide. Chemical reactions like this are running at catalyst temperatures of more than 800 °C. The appropriate design of the microwave assisted reactor requires the exact knowledge of the dielectric properties of the catalyst and catalyst support materials up to those high temperatures. For this purpose a measurements system based on the cavity perturbation method was built. The system is using a rectangular TE104 cavity with a resonance frequency at 2.45 GHz and a quality factor Q ≈ 12000. A novel synthetic calibration method based on numerical full-wave modeling has been developed as an alternative to traditional calibration methods. The results of high temperature dielectric measurements for polyether ether ketone (PEEK), MACOR glass ceramics and zirconia are presented.
Keywords
calibration; dielectric measurement; glass ceramics; microwave measurement; nondestructive testing; perturbation techniques; polymers; MACOR glass ceramics; PEEK; carbon dioxide-carbon monoxide conversion; catalyst dielectric properties; catalyst support material; catalytic conversion; cavity perturbation method; frequency 2.45 GHz; high temperature dielectric measurements; microwave assisted reactor; microwave cavity perturbation technique; numerical full wave modeling; polyether ether ketone; rectangular TE104 cavity; synthetic calibration method; Calibration; Cavity resonators; Dielectric measurement; Dielectrics; Materials; Microwave measurement; Temperature measurement; Cavity resonators; high temperature dielectric measurements; numerical simulation; perturbation method;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest (IMS), 2013 IEEE MTT-S International
Conference_Location
Seattle, WA
ISSN
0149-645X
Print_ISBN
978-1-4673-6177-4
Type
conf
DOI
10.1109/MWSYM.2013.6697793
Filename
6697793
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