• DocumentCode
    664814
  • Title

    Safe memory read-path using silent CRC calculation of binary bit-inversion for low-power fast ROM integrity verifcation

  • Author

    Daejin Park ; Tag Gon Kim

  • Author_Institution
    Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
  • fYear
    2013
  • fDate
    9-11 Sept. 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The integrity verifcation of on-chip fash memory data as code memory is becoming important in microcontroller-based applications. On-the-fy memory fail-detection without any interruption of CPU operation requires a fast detection method and low-power fash access hardware to provide safety-conscious execution of the user-programmed frmware during system operations. In this paper, newly-designed read-path architecture for an on-chip fash-embedded microcontroller is proposed in order to provide a memory scrambling method that enables fail-safe low-power memory access with zero hardware overhead by embedding the scramble fags on the CRC protection code. Time-multiplexed CRC calculation for bit-inversion binary code is automatically executed with the silent background mode during CPU idle time without any CPU wait cost. Te implementation result shows the de-inversion procedure could be achieved with only additional 1024 bits CRC data in case of 64 sectors for 4 KB fash memory by reducing 75% area of the previous work.
  • Keywords
    microcontrollers; read-only storage; system-on-chip; CPU operation; binary bit-inversion; code memory; fast detection method; low-power fash access hardware; low-power fast ROM integrity verifcation; microcontroller-based applications; on-chip fash memory data; on-the-fy memory fail-detection; safe memory read-path; silent CRC calculation; Binary codes; Flash memories; Hardware; Memory management; Microcontrollers; Read only memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics ?? Berlin (ICCE-Berlin), 2013. ICCEBerlin 2013. IEEE Third International Conference on
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4799-1411-1
  • Type

    conf

  • DOI
    10.1109/ICCE-Berlin.2013.6697973
  • Filename
    6697973