• DocumentCode
    665292
  • Title

    Micro-structural changes and crack propagation in solder joints due to vibration

  • Author

    Reichling, Bastian ; Fix, Alexander ; Ratchev, R. ; Wilde, J.

  • Author_Institution
    Robert Bosch GmbH, Schwieberdingen, Germany
  • fYear
    2013
  • fDate
    9-12 Sept. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The effects of vibration on the micro-structure of the solder alloy SAC305 (96.5 wt.-% tin, 3 wt.-% silver and 0.5 wt.-% copper) were investigated. Chip resistors were soldered onto printed circuit boards and exposed to constant sinusoidal vibration at room temperature. The investigation was focused on the interaction between surface morphology and micro-structure of the solder joint and crack propagation. It is shown that vibration load leads to micro-structural changes of soldered interconnections. In the initial state solder joints usually consist of few grains. Under vibration-induced aging, the micro-structure changes towards smaller grain sizes and also micro-cracks are initiated. After critical crack length is reached, the crack propagation accelerates. This leads to cracks through the whole solder joint and finally to failure of the assembly. It was observed that a characteristic crack path is formed. In contrast to temperature shock tests the crack is initiated at the surface of the solder joint meniscus instead of its standoff. Furthermore, crack propagation due to vibration is inter-granular as well as trans-granular, while in temperature shock tests only inter-granular cracks develop.
  • Keywords
    ageing; copper alloys; cracks; printed circuits; resistors; silver alloys; soldering; surface morphology; thermal shock; tin alloys; vibrations; characteristic crack path; chip resistors; crack propagation; critical crack length; intergranular cracks; microstructural changes; printed circuit boards; sinusoidal vibration; solder joints; soldered interconnections; surface morphology; temperature 293 K to 298 K; temperature shock tests; vibration induced aging; Copper; Electric shock; Lead; Resistors; Soldering; Surface cracks; Vibrations; chip resistor; crack propagation; micro-structure; solders joint; vibration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics Packaging Conference (EMPC) , 2013 European
  • Conference_Location
    Grenoble
  • Type

    conf

  • Filename
    6698610