• DocumentCode
    665334
  • Title

    Impact of pad finish on mechanical shock resistance of lead-free solder joints tested under shear and in pull mode

  • Author

    Vandevelde, B. ; Van Kerckhove, Matthias ; Degryse, Dominiek ; D´Haese, Wim ; Schaubroeck, David ; Allaert, Bart ; Geerinckx, Eddy ; Lauwaert, Ralph ; Willems, Geert

  • Author_Institution
    Imec, Leuven, Belgium
  • fYear
    2013
  • fDate
    9-12 Sept. 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Fracture of Intermetallic Compounds (IMC) under mechanical shock is a major concern for soldered components. While most shock tests are performed under shear load, a specially designed sample setup is designed and fabricated allowing testing under axial pull direction. These samples are fabricated with two pad finish - NiAu and SAC HASL - and comparing solder mask versus non-solder-mask pad defined solder joints. A mini scale of the Charpy equipment setup measures the energy taken up by the solder joints before fracture. The impact of thermal ageing on the shock resistance is also investigated.
  • Keywords
    ageing; brittle fracture; integrated circuit interconnections; nickel alloys; solders; Charpy equipment setup; IMC; NiAu; SAC HASL; axial pull direction; fracture; intermetallic compounds; lead-free solder joints; mechanical shock; pad finish; shock resistance; shock tests; solder mask; soldered components; thermal ageing; Aging; Electric shock; Electrical resistance measurement; Nickel; Resistance; Soldering; Tin; HASL and NiAu pad finish; IMC fracture; mechanical shock resistance; thermal ageing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics Packaging Conference (EMPC) , 2013 European
  • Conference_Location
    Grenoble
  • Type

    conf

  • Filename
    6698656