DocumentCode :
665568
Title :
Quantifying software test process and product reliability simultaneously
Author :
Ikemoto, Shuhei ; Dohi, Tadashi ; Okamura, Hiroyuki
Author_Institution :
Dept. of Inf. Eng., Hiroshima Univ., Higashi-Hiroshima, Japan
fYear :
2013
fDate :
4-7 Nov. 2013
Firstpage :
108
Lastpage :
117
Abstract :
Software reliability models (SRMs) are used to assess software reliability and to control quantitatively software testing. In this paper we consider metrics-based SRMs and tackle a statistical estimation of both software test process and product reliability simultaneously. The basic idea is to apply the Markov-dependent Poisson regression to describe the random testing environment by a discrete-time Markov chain. We formulate four Markov-dependent Poisson regression-based SRMs and develop the EM (expectation-maximization) algorithms to estimate the maximum likelihood estimates of model parameters. Numerical examples with real software project data show that our approach is useful to quantify both of software test process and software product reliability, and can answer the question why the stability of test process can lead to the improvement of software product reliability.
Keywords :
Markov processes; expectation-maximisation algorithm; maximum likelihood estimation; program testing; random processes; regression analysis; software metrics; software reliability; EM algorithms; Markov-dependent Poisson regression-based SRM; discrete-time Markov chain; expectation-maximization algorithms; maximum likelihood estimates; metric-based SRM; model parameters; product reliability; quantitative software testing control; random testing environment; software product reliability models; software project data; software test process stability; statistical estimation; Silicon; EM algorithm; Markov-dependent Poisson regression; software metrics; software reliability; software test process;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Reliability Engineering (ISSRE), 2013 IEEE 24th International Symposium on
Conference_Location :
Pasadena, CA
Type :
conf
DOI :
10.1109/ISSRE.2013.6698910
Filename :
6698910
Link To Document :
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