DocumentCode :
665604
Title :
What is biometric information and how to measure it?
Author :
Sutcu, Yagiz ; Tabassi, Elham ; Sencar, Husrev T. ; Memon, Nasir
Author_Institution :
Dept. of Comput. Sci. & Eng., Polytech. Inst. of NYU, New York, NY, USA
fYear :
2013
fDate :
12-14 Nov. 2013
Firstpage :
67
Lastpage :
72
Abstract :
Being able to measure the information content of biometric data has significant importance. However, it is not only difficult to define the biometric information conceptually, but also a challenging estimation problem due to many practical issue such as, different feature representation of different biometric modalities, unknown feature distributions, limited sample size, etc. In this paper, we provided a summary of the several proposed approaches and discuss their merits and shortcomings of these works and focused on techniques which are based on relative entropy. We also introduced a user-specific biometric information measure and evaluated these measures using iris biometric. We explored the effect of the biometric sample quality on the biometric information measurements using different subsets of the iris data with different quality levels. We also investigated the effect of binarization/encoding phase in the iris recognition on the biometric information by comparing our results obtained from image and binary feature domain.
Keywords :
entropy; feature extraction; image coding; image representation; iris recognition; binarization phase; binary feature domain; biometric data; biometric modalities; biometric sample quality; encoding phase; feature distributions; feature representation; image feature domain; information content; iris biometric; iris data; iris recognition; quality levels; relative entropy; user-specific biometric information measurement; Biomedical imaging; Databases; Entropy; Iris recognition; Mathematical model; Principal component analysis; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Technologies for Homeland Security (HST), 2013 IEEE International Conference on
Conference_Location :
Waltham, MA
Print_ISBN :
978-1-4799-3963-3
Type :
conf
DOI :
10.1109/THS.2013.6698978
Filename :
6698978
Link To Document :
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