Title :
Structural and functional vulnerability analysis for survivability of Smart Grid and SCADA network under severe emergencies and WMD attacks
Author :
Chopade, Pravin ; Bikdash, Marwan
Author_Institution :
Comput. Sci. & Eng., North Carolina A&T State Univ., Greensboro, NC, USA
Abstract :
A Novel or Methodological approach to comprehensively analyze the vulnerability of interdependent infrastructures is introduced in our paper; two types of vulnerability are considered: structural vulnerability and functional vulnerability. For structural vulnerability, infrastructures topologies are the only information while operating regimes of different infrastructures are further taken into consideration to analyze functional vulnerability. In this paper, we propose a flexible and extensible framework for network survivability testing and evaluation based interdependency modeling of Smart Grid and SCADA network. We developed novel approach for vulnerability reduction considering both structural and functional vulnerability. We computed interdependent effect between these networks under different conditions. We used MATLAB for simulation and analysis of methodology developed by us for interdependency analysis. The contribution of this paper provides a feasible research approach for the normalization of network survivability testing and evaluation and the promotion of network survivability research.
Keywords :
SCADA systems; power system reliability; power system security; smart power grids; SCADA network; WMD attacks; functional vulnerability analysis; infrastructures topologies; interdependent infrastructures; network survivability testing; severe emergencies; smart grid interdependency modeling; smart grid survivability; structural vulnerability analysis; weapons of mass destruction; Educational institutions; Mathematical model; Network topology; Security; Smart grids; Substations; Topology; Interdependency modeling; SCADA; Smart Grid; Vulnerability; WMD attack;
Conference_Titel :
Technologies for Homeland Security (HST), 2013 IEEE International Conference on
Conference_Location :
Waltham, MA
Print_ISBN :
978-1-4799-3963-3
DOI :
10.1109/THS.2013.6698983