• DocumentCode
    665800
  • Title

    Assessment of the reverse operational characteristics of SiC JFETs in a diode-less inverter

  • Author

    Kampitsis, G. ; Stefas, P. ; Chrysogelos, N. ; Papathanassiou, S. ; Manias, S.

  • Author_Institution
    Electr. Machines & Power Electron. Lab., Nat. Tech. Univ. of Athens, Zografos, Greece
  • fYear
    2013
  • fDate
    10-13 Nov. 2013
  • Firstpage
    477
  • Lastpage
    482
  • Abstract
    In this paper, a thorough analysis of the reverse conduction characteristics of vertical trench (VT) Silicon Carbide (SiC) junction field effect transistors (JFETs) is performed. While these power devices do not encompass a body diode, traditionally present in conventional Silicon (Si) based semiconductors, such as the metal-oxide semiconductor field-effect transistors (MOSFETs), they exhibit notable reverse properties such that an external antiparallel diode can be considered redundant in most power converter applications. Both enhancement mode and depletion mode SiC JFETs are examined in terms of static reverse operation. Their performance is initially validated through simulation testing by constructing new SiC JFET models in Pspice model editor. The theoretical and simulation results are confirmed via experimental testing in a three phase voltage source inverter with and without antiparallel SiC diodes. When a gate drive that protects the semiconductor during reverse operation, while presenting great switching and forward conduction characteristics, is introduced, the power converter´s overall performance is investigated paying particular attention to power losses during the dead time interval.
  • Keywords
    driver circuits; invertors; junction gate field effect transistors; power field effect transistors; semiconductor device models; semiconductor diodes; silicon compounds; switching convertors; wide band gap semiconductors; Pspice model editor; SiC; SiC JFETs; diode-less inverter; drive circuit; power converter; power losses; reverse operational characteristics; simulation testing; static reverse operation; three phase voltage source inverter; vertical trench silicon carbide junction field effect transistors; Inverters; JFETs; Logic gates; Semiconductor diodes; Silicon carbide; Threshold voltage; Voltage control; SiC JFETs; drive circuit; inverter; reverse operation; saturation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
  • Conference_Location
    Vienna
  • ISSN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2013.6699182
  • Filename
    6699182