Title :
GaN HEMT devices: Experimental results on normally-on, normally-off and cascode configuration
Author :
Sorrentino, G. ; Melito, Maurizio ; Patti, Anand ; Parrino, Giovanni ; Raciti, Angelo
Author_Institution :
IPG R&D, STMicroelectron., Catania, Italy
Abstract :
Power electronics systems play key function in power management and motion control: power consumption and volume reduction are strongly required in new applications oriented to protect environment. Moreover, a switching frequency increase is demanded for microwave and power switching applications, thus reducing passive component and converter volume: however, increasing the switching frequency directly increases switching losses. Also, switching applications are very demanding, because semiconductor switches are required to withstand high voltage in reverse condition and handle large current in forward operation mode. New material and new devices are studied to satisfy such requirements, like SiC and GaN devices. In this work, several 600-V class GaN-on-Si HEMT prototypes are presented. These devices have been designed and developed for power switching converter applications. In order to offer a complete scenario of GaN-on-Si HEMT technology, normally-on, normally-off, and cascode-connected devices have been characterized. Achieved experimental results of static and pulsed measurements are then shown.
Keywords :
high electron mobility transistors; GaN; HEMT devices; HEMT prototypes; cascode configuration; cascode connected devices; converter volume; microwave; motion control; passive component; power consumption; power electronics systems; power management; power switching applications; power switching converter applications; pulsed measurements; reverse condition; semiconductor switches; switching frequency; switching losses; volume reduction; Capacitance; Gallium nitride; HEMTs; Logic gates; Performance evaluation; Silicon; Switches;
Conference_Titel :
Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
Conference_Location :
Vienna
DOI :
10.1109/IECON.2013.6699239