Title : 
Steady-state analysis of a 5-level bidirectional buck+boost dc-dc converter
         
        
            Author : 
Costa, Levy Ferreira ; Mussa, Samir Ahmad ; Barbi, Ivo
         
        
            Author_Institution : 
Power Electron. Inst.-INEP, Fed. Univ. of Santa Catarina-UFSC, Florianopolis, Brazil
         
        
        
        
        
        
            Abstract : 
This paper presents a nonisolated multilevel buck+boost dc-dc converter suitable for high voltage and high power application. It is composed by a Buck-type and a Boost-type converters, both multilevel and bidirectional. The main features of proposed converter are: reduced voltage stress across the semiconductors, allowing its use in high voltage; bidirectional power flow; frequency operation of the inductor is a multiple of the switching frequency, reducing the volume of magnetic component. This paper focuses on the five-level structure of the proposed converter, in which the theoretical analysis is carried out and discussed. In order to validate the theoretical analysis, a prototype with 10 kW output power capability, 1 kV to 750 V input-to-output voltage and 20 kHz of switching frequency was constructed and experimented. The results attest the advantages of the new dc-dc topology and it is reported herein.
         
        
            Keywords : 
DC-DC power convertors; power semiconductor devices; 5-level bidirectional buck+boost DC-DC converter; bidirectional power flow; dc-dc topology; frequency 20 kHz; frequency operation; high power application; high voltage application; input-to-output voltage; magnetic component volume reduction; nonisolated multilevel buck+boost DC-DC converter; output power capability; power 1 kW; power 10 kW; steady-state analysis; switching frequency; voltage 750 V; voltage stress reduction; Capacitors; Equations; Inductance; Inductors; Prototypes; Steady-state; Topology;
         
        
        
        
            Conference_Titel : 
Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
         
        
            Conference_Location : 
Vienna
         
        
        
        
            DOI : 
10.1109/IECON.2013.6699318