Title :
The electromagnetic relay test system based on TMS320F28335
Author :
Yuye Wang ; Fengling Han ; Wei Xiang ; Guangrui Xu
Author_Institution :
Coll. of Inf. & Commun. Eng., Harbin Eng. Univ., Harbin, China
Abstract :
An electromagnetic relay test system is designed based on the 32-bit floating-point Microcontrollers (MCU): TMS320F28335. In the test system, the relay characteristic parameters, such as the coil resistance, pull-in voltage, release voltage and time parameters, can be tested by sampling of the relay coil current, electric shock voltage and drive supply voltage. The tested results can be displayed on the LCD and transmitted to PC. The sampling frequency of the system is 10 M Hertz, which is higher than the other relay test system. The whole system is portable and has low power consumption. Finally, the experimental results verify that the required parameters of the relay can be tested accurately using the designed system.
Keywords :
electric potential; microcontrollers; MCU; TMS320F28335; coil resistance; drive supply voltage; electric shock voltage; electromagnetic relay test system; floating point microcontrollers; pull-in voltage; relay coil current; sampling frequency; Coils; Educational institutions; Electromagnetics; Relays; Reliability; Resistance; Testing; TMS320F28335; coil resistance; relay characteristic parameters; release voltage;
Conference_Titel :
Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
Conference_Location :
Vienna
DOI :
10.1109/IECON.2013.6699329