Title :
Quality assessment of row crop plants by using a machine vision system
Author :
Weyrich, Michael ; Yongheng Wang ; Scharf, Michael
Author_Institution :
Inst. of Ind. Autom. & Software Eng., Univ. of Stuttgart, Stuttgart, Germany
Abstract :
This paper reports research results on developing a machine vision system to assess the quality of row crop plants. Comparing to the prevalent machine vision system employed in agricultural industry for weed-crops classification as well as plant density evaluation, the proposed machine vision system is able to detect the location of plants (weed / crops) and calculate the leaves´ area for plant quality assessment, even if the leaves are overlapped with each other. The developed machine vision system involves a camera system and an image processing system. The camera system uses a coaxial camera constructed by a RGB sensor and near infrared (NIR) sensor, which cooperate with a white front lighting and NIR front lighting respectively. Plants are firstly captured by the coaxial camera. The plants are segmented from background on RGB image; the overlapping edges of leaves are detected on NIR image. Afterwards the overlapping leaves are separated and assigned to the assessed stem position of plants. At last, based on the assigned leaves, the plants are separated, and the area of plant canopy is calculated. A set of experiments have been made to prove the feasibility of the proposed machine vision system.
Keywords :
agricultural engineering; agriculture; cameras; computer vision; crops; image segmentation; image sensors; quality control; NIR image; RGB image; RGB sensor; agricultural industry; coaxial camera; image processing system; image segmentation; machine vision system; near infrared sensor; overlapping leaves; plant canopy; plant density evaluation; plant quality assessment; plants location; row crop plants; weed-crops classification; Agriculture; Cameras; Image color analysis; Image edge detection; Image segmentation; Lighting; Machine vision; crop plants; machine vision; plant segmentation, plant localization, plant quality; quality assessment;
Conference_Titel :
Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
Conference_Location :
Vienna
DOI :
10.1109/IECON.2013.6699518