• DocumentCode
    666254
  • Title

    Dither based precise position control of piezo actuated micro-nano manipulator

  • Author

    Shome, Saikat Kr ; Pradhan, Subrata ; Mukherjee, Arjun ; Datta, Uma

  • Author_Institution
    E&I Group, CMERI, Durgapur, India
  • fYear
    2013
  • fDate
    10-13 Nov. 2013
  • Firstpage
    3486
  • Lastpage
    3491
  • Abstract
    This paper addresses the problem of hysteresis and presents a new control scheme for hysteresis compensation of piezo-electrically actuated micro-nano manipulators. The technology employs an Inverse Dahl model based feed-forward mechanism in combination with a feedback control algorithm along with simultaneous voltage and displacement dither strategy. The actuator performance is seen to improve as a function of injected noise level into the plant- a phenomenon known as dithering. The notion of stochastic resonance for nano positioning is studied to determine the optimal dither level for efficient plant performance. The efficacy of the proposed control scheme has been confirmed through rigorous simulations in terms of two specific tests- a) tracking error test and b) hysteresis curve area test. Results show an enhanced positioning precision of the manipulator with the proposed dither control than without it. Owing to its algorithmic simplicity, the proposed control genre can be extended to the parlance of other nano-scale applications.
  • Keywords
    feedback; feedforward; hysteresis; micromanipulators; nanopositioning; piezoelectric actuators; precision engineering; stochastic processes; actuator performance; dither based precise position control; feedback control algorithm; hysteresis compensation control scheme; hysteresis curve area test; hysteresis problem; injected noise level; inverse Dahl model based feedforward mechanism; nanopositioning; optimal dither level; piezoelectrically actuated micro-nano manipulators; plant performance; positioning precision; simultaneous voltage-displacement dither strategy; stochastic resonance; tracking error test; Feedback control; Hysteresis; Manipulators; Noise; Quantization (signal); Stochastic resonance; Voltage control; Dahl model; Nano positioning; feedback compensation; stochastic resonance; tracking error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
  • Conference_Location
    Vienna
  • ISSN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2013.6699689
  • Filename
    6699689