DocumentCode :
666317
Title :
Comparative analysis of manifold learning algorithms for tomographic sensor processing
Author :
Morales, C. ; Lotero, F. ; Sbarbaro, D.
Author_Institution :
Dept. of Electr. Eng., Univ. de Concepcion, Concepcion, Chile
fYear :
2013
fDate :
10-13 Nov. 2013
Firstpage :
3898
Lastpage :
3903
Abstract :
Electrical Impedance Tomography sensors are non-intrusive sensors used to estimate conductivity fields. These estimates are based on a set of measured induced voltages generated by some currents injected to the process. Processing the measurements of an EIT sensor to estimate the underlying changes in the conductivity field requires the use of high dimensional models and solve a nonlinear optimization problem. In some applications the changes in the conductivity are due to changes in just a couple of factors, and therefore the sensor output can be described by a set of variables lying in a lower dimensional space. Manifold Learning Algorithms can learn these low dimensional spaces embedded in the measurement space. In this work, three popular MLA are analyzed as tools to discover manifolds in the EIT measuring space. Several simulations and experimental results show that Laplacian eigenmap algorithm is a suitable MLA for this type of applications.
Keywords :
electric impedance imaging; electric sensing devices; electrical conductivity measurement; learning (artificial intelligence); optimisation; conductivity fields; electrical impedance tomography sensors; high dimensional models; manifold learning algorithms; nonlinear optimization problem; tomographic sensor processing; Conductivity; Laplace equations; Manifolds; Mathematical model; Tomography; Trajectory; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
Conference_Location :
Vienna
ISSN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2013.6699758
Filename :
6699758
Link To Document :
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