DocumentCode :
666498
Title :
Test bench and quality measures for non-intrusive load monitoring algorithms
Author :
Klein, Peter ; Merckle, Jean ; Benyoucef, D. ; Bier, T.
Author_Institution :
Univ. Furtwangen, Furtwangen, Germany
fYear :
2013
fDate :
10-13 Nov. 2013
Firstpage :
5006
Lastpage :
5011
Abstract :
Non-intrusive load monitoring (NILM) is the process of detecting the operation of electrical appliances from the data provided by a smart meter. This information can be useful in many fields, e.g. energy consumption and cost analysis, load prediction, or even ambient assisted living. Many NILM algorithms have been developed in the past but a well-founded comparison was impossible. This is due to the fact that it is very hard to generate suitable data sets. In this paper we describe one way to achieve this with very low effort. Furthermore we define several numbers for judging on the quality of NILM algorithms allowing for an easier comparison. They are a basis for our future work with NILM systems.
Keywords :
domestic appliances; smart meters; NILM algorithms; ambient assisted living; cost analysis; electrical appliances; energy consumption; load prediction; nonintrusive load monitoring algorithms; quality measures; smart meter; test bench; Algorithm design and analysis; Classification algorithms; Detectors; Event detection; Home appliances; Switches; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, IECON 2013 - 39th Annual Conference of the IEEE
Conference_Location :
Vienna
ISSN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2013.6699946
Filename :
6699946
Link To Document :
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