• DocumentCode
    66745
  • Title

    VLSI Compatible Parallel Fabrication of Scalable Few Electron Silicon Quantum Dots

  • Author

    Lin, Yun P. ; Perez-Barraza, Julia I. ; Husain, Muhammad K. ; Alkhalil, Feras M. ; Lambert, Nicholas ; Williams, David A. ; Ferguson, A.J. ; Chong, H.M.H. ; Mizuta, Hiroshi

  • Author_Institution
    Fac. of Phys. & Appl. Sci., Univ. of Southampton, Southampton, UK
  • Volume
    12
  • Issue
    6
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    897
  • Lastpage
    901
  • Abstract
    One-hundred ninety-two highly tuneable high density lithographically defined Si dual double quantum dots (DQDs) are fabricated for the first time in parallel via a scalable VLSI compatible fabrication process for the realization of single electron qubits for quantum computing. 25 nm DQDs with less than 5 nm in dimensional variation are achieved via the use of Hydrogen silsesquioxane resist and electron beam lithography. Repeatable coulomb oscillations and coulomb diamonds signifying single electron tunnelling are observed in the electrical characteristics of a Si DQD structure. This demonstrates the viability and dimensionality of our system and paves the way for single electron spin manipulation in scalable Si-based systems.
  • Keywords
    VLSI; diamond; electron resists; elemental semiconductors; quantum computing; semiconductor quantum dots; silicon; silicon-on-insulator; tunnelling; DQD structure; Si; VLSI compatible parallel fabrication; coulomb diamonds; dimensional variation; dual double quantum dots; electrical characteristics; electron beam lithography; electron silicon quantum dots; electron spin manipulation; hydrogen silsesquioxane resist; quantum computing; repeatable coulomb oscillations; scalable VLSI compatible fabrication process; silicon-on-insulator; single electron qubits; single electron tunnelling; size 25 nm; system dimensionality; system viability; Coulomb blockade; SET; Si Quantum dots; fabrication; hydrogen sil-sesquioxane (HSQ); silicon-on-insulator (SOI);
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2013.2263964
  • Filename
    6517260