Title :
Physical model of phase noise in feedback oscillator
Author :
Xianhe Huang ; Wei Fu ; Pingping Chen ; Hongyuan Huang
Author_Institution :
Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
The paper mainly focuses on the effect on the oscillator phase noise by the loaded quality factor QL in Classical Leeson Model, derives that the equivalent circuit parameters of resonator and the oscillation circuit parameters have conclusive concern with the loaded quality factor QL. And the experimental verification is made on the basis of two kinds of oscillator circuits (Pierce oscillator circuit and Butler common-base oscillator circuit) and three kinds of acoustic resonators (120MHz SC-cut crystal resonator, 315 MHz one-port SAW resonator and 10.7 MHz LiTaO3 BAW resonator). The further experiment shows the changes of the crystal oscillator phase noise with different drive levels and presents that besides some parameters such as QL, the crystal resonator amplitude-frequency (AF) characteristics can also affect the oscillator phase noise apparently. And then, the acoustic oscillator phase noise model can be established on the basis of the physics, which contains the resonator equivalent parameters, the oscillator circuit parameters and the affection of the resonator AF characteristics.
Keywords :
Q-factor; circuit noise; crystal resonators; feedback oscillators; lithium compounds; phase noise; surface acoustic wave resonators; BAW resonator; Butler common-base oscillator circuit; LiTaO3; Pierce oscillator circuit; SAW resonator; acoustic resonators; classical leeson model; crystal resonator; feedback oscillator; frequency 10.7 MHz; frequency 120 MHz; frequency 315 MHz; oscillator circuit parameters; oscillator phase noise; quality factor; Crystals; Frequency modulation; Noise measurement; Phase measurement; Phase noise; Q-factor;
Conference_Titel :
European Frequency and Time Forum & International Frequency Control Symposium (EFTF/IFC), 2013 Joint
Conference_Location :
Prague
DOI :
10.1109/EFTF-IFC.2013.6702086