X-ray imaging of the surface acoustic wave propagation in La3Ga5SiO14 crystal

Author

Roshchupkin, Dmitry ; Ortega, L. ; Snigirev, Anatolii ; Snigireva, Iraida

Author_Institution

Inst. of Microelectron. Technol. & High-Purity Mater., Chernogolovka, Russia

fYear

2013

fDate

21-25 July 2013

Firstpage

683

Lastpage

686

Abstract

Direct imaging of a 10 μm surface acoustic wave (SAW) propagation in a La₃Ga₅SiO₁₄ (LGS) crystal was obtained on the ESRF synchrotron radiation source in the saggital diffraction geometry using the Talbot effect. Imaging of the SAW wave field with the period 10 μm was observed at a distance corresponding to the Talbot distance. It is shown that the presence of the growth banding in the crystal does not influence on the propagation of acoustic wave-fields in the crystal nor does it cause a distortion of the SAW wave front.

Keywords

X-ray imaging; acoustic wave propagation; crystals; lanthanum compounds; surface acoustic waves; ESRF synchrotron radiation source; LGS crystal; La₃Ga₅SiO₁₄; SAW wave field; SAW wave front; Talbot distance; Talbot effect; X-ray imaging; acoustic wave-fields propagation; distortion; saggital diffraction geometry; surface acoustic wave propagation; Crystals; Surface acoustic waves; Surface topography; X-ray diffraction; X-ray imaging; La3Ga5SiO14 crystal; Talbot effect; X-ray diffraction; ssynchrotron radiation; surface acoustic waves;

fLanguage

English

Publisher

ieee

Conference_Titel

European Frequency and Time Forum & International Frequency Control Symposium (EFTF/IFC), 2013 Joint

Conference_Location

Prague

Type

conf

DOI

10.1109/EFTF-IFC.2013.6702091

Filename

6702091