DocumentCode :
667903
Title :
Reduction of anchor losses by etched slots in aluminum nitride contour mode resonators
Author :
Cassella, Cristian ; Segovia-Fernandez, Jeronimo ; Piazza, Gianluca ; Cremonesi, Massimiliano ; Frangi, Alejandro
Author_Institution :
Electr. & Comput. Eng, Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2013
fDate :
21-25 July 2013
Firstpage :
926
Lastpage :
929
Abstract :
This paper presents a new technique to increase the quality factor, Q, of AlN Contour Mode Resonators (CMRs). The technique uses etched slots in the body of AlN CMRs to reduce energy dissipation through the anchors. The reduction of the energy lost through the supporting anchors improves the device Q without altering its electromechanical coupling, kt2. An almost 50% improvement in the Figure of Merit, FoM, defined as the product between Q and kt2, has been measured in 220 MHz AlN CMRs.
Keywords :
III-V semiconductors; VHF circuits; electromechanical effects; etching; losses; resonators; wide band gap semiconductors; AlN; CMR; FoM; aluminum nitride contour mode resonator; anchor loss reduction; electromechanical coupling; energy dissipation reduction; energy lost reduction; figure of merit; frequency 220 MHz; quality factor; slot etching; Acoustics; Films; III-V semiconductor materials; Metals; Q-factor; Resonant frequency; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Frequency and Time Forum & International Frequency Control Symposium (EFTF/IFC), 2013 Joint
Conference_Location :
Prague
Type :
conf
DOI :
10.1109/EFTF-IFC.2013.6702267
Filename :
6702267
Link To Document :
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