Title :
Aluminum Nitride nano-plate infrared sensor with self-sustained CMOS oscillator for nano-watts range power detection
Author :
Yu Hui ; Rinaldi, Matteo
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
Abstract :
This paper presents, for the first time, a fast (thermal time constant of 1.3 ms) and sensitive (responsivity of 310 Hz/μW) Infrared detector consisting of an Aluminum Nitride (AlN) nano-plate resonator (NPR) connected to a compact and low power CMOS self-sustained oscillator (fabricated in the AMIS 0.5 μm CMOS process) as a direct frequency readout. A high performance (quality factor Q = 1283 and electromechanical coupling coefficient kt2 = 1.56%) MEMS resonant structure based on a thin AlN (250 nm thick) NPR coated with Si3N4 (100 nm thick) as IR absorber was fabricated and tested, showing a measured temperature coefficient of frequency (TCF) of -35 ppm/K and FEM simulated temperature rise factor of 72.5 mK/μW. Thanks to the high electromechanical performance of the MEMS resonator, a compact and low power (2.3 mW) self-sustained CMOS oscillator circuit was used as a direct frequency readout, enabling the demonstration of a novel uncooled IR detector with a low Noise Equivalent Power (NEP) of 3.5 nW/Hz1/2.
Keywords :
CMOS integrated circuits; III-V semiconductors; aluminium compounds; crystal resonators; infrared detectors; micromechanical resonators; oscillators; readout electronics; wide band gap semiconductors; AlN; FEM simulated temperature rise factor; IR absorber; MEMS resonant structure; aluminum nitride nanoplate infrared sensor; direct frequency readout; electromechanical coupling coefficient; infrared detector; low noise equivalent power; low power CMOS oscillator; nanowatts range power detection; power 2.3 mW; quality factor; self-sustained CMOS oscillator; size 0.5 mum; size 250 nm; temperature coefficient of frequency; CMOS integrated circuits; Detectors; Frequency measurement; III-V semiconductor materials; Micromechanical devices; Oscillators; Resonant frequency; Aluminum Nitride; Infrared Sensor; MEMS Resonators; MEMS-CMOS Oscillator;
Conference_Titel :
European Frequency and Time Forum & International Frequency Control Symposium (EFTF/IFC), 2013 Joint
Conference_Location :
Prague
DOI :
10.1109/EFTF-IFC.2013.6702280