Title :
Integrated failure model for analog circuit simulation based on Saber platform
Author :
Tao Wang ; Hui Zhang ; Hua Zhang
Author_Institution :
China Aero-Polytechnology Establ., Beijing, China
Abstract :
A new failure model based on Saber platform is proposed to simulate familiar failure mode of analog circuit, such as open-circuit and short-circuit mode. With this new model, it becomes much easier and more convenient to carry out fault injection and failure simulation in analog circuit simulation. By using a representative case, it is validated that the integrated fault model is correct and the injection of this fault model is feasible.
Keywords :
analogue circuits; circuit simulation; fault simulation; integrated circuit modelling; Saber platform; analog circuit simulation; failure simulation; fault injection; integrated failure model; integrated fault model; open-circuit mode; short-circuit mode; Analog circuits; Capacitors; Circuit faults; Computational modeling; Integrated circuit modeling; Load modeling; Resistance; Saber; fault injection; fault mode; fault simulation; modeling;
Conference_Titel :
Consumer Electronics, Communications and Networks (CECNet), 2013 3rd International Conference on
Conference_Location :
Xianning
Print_ISBN :
978-1-4799-2859-0
DOI :
10.1109/CECNet.2013.6703348
