DocumentCode :
668850
Title :
Study of high reliability NoC based on power gating
Author :
Hua Zhang ; Chunzhi Liu ; Tao Wang ; Hui Zhang
Author_Institution :
China Aero-Polytechnology Establ., Beijing, China
fYear :
2013
fDate :
20-22 Nov. 2013
Firstpage :
623
Lastpage :
626
Abstract :
Due to extensibility and high performance of Network on Chip (NoC), it has been considered as a new paradigm in the next generation communication architecture. However, increased power consumption has reduced the reliability of NoC and hindered its wide-deployment. In this paper, we propose a new design of high reliability NoC based on Power Gating, which can switch routers on or off by monitoring each port of routers. Our study shows that the proposed method is effective in reducing static power and improving reliability.
Keywords :
integrated circuit design; integrated circuit reliability; network-on-chip; power consumption; NoC; network on chip; next generation communication architecture; power consumption; power gating; routers; static power; Computer architecture; Leakage currents; Monitoring; Payloads; Power demand; Reliability; Switches; NoC; high reliabilit; lower power; power gating; router;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Consumer Electronics, Communications and Networks (CECNet), 2013 3rd International Conference on
Conference_Location :
Xianning
Print_ISBN :
978-1-4799-2859-0
Type :
conf
DOI :
10.1109/CECNet.2013.6703408
Filename :
6703408
Link To Document :
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